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Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique
The two photon absorption-transient current technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector and a standard str...
Autores principales: | , , , |
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Lenguaje: | eng |
Publicado: |
2022
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.3390/s23020962 http://cds.cern.ch/record/2853386 |
_version_ | 1780977206041772032 |
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author | Pape, Sebastian Curras, Esteban Fernandez Garcia, Marcos Moll, Michael |
author_facet | Pape, Sebastian Curras, Esteban Fernandez Garcia, Marcos Moll, Michael |
author_sort | Pape, Sebastian |
collection | CERN |
description | The two photon absorption-transient current technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector and a standard strip detector as an example. The influence of laser beam clipping and reflection is shown, and a method that allows to compensate these intensity-related effects for investigation of the electric field is introduced and successfully employed. Additionally, the mirror technique is introduced, which exploits reflection at a metallised back side to enable the measurement directly below a top metallisation while illuminating from the top. |
id | cern-2853386 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2022 |
record_format | invenio |
spelling | cern-28533862023-06-16T09:31:47Zdoi:10.3390/s23020962http://cds.cern.ch/record/2853386engPape, SebastianCurras, EstebanFernandez Garcia, MarcosMoll, MichaelTechniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Techniquephysics.ins-detDetectors and Experimental TechniquesThe two photon absorption-transient current technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector and a standard strip detector as an example. The influence of laser beam clipping and reflection is shown, and a method that allows to compensate these intensity-related effects for investigation of the electric field is introduced and successfully employed. Additionally, the mirror technique is introduced, which exploits reflection at a metallised back side to enable the measurement directly below a top metallisation while illuminating from the top.The Two Photon Absorption - Transient Current Technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector as an example. The influence of laser beam clipping and reflection is shown and a method that allows to compensate these intensity related effects for the investigation of the electric field is introduced and successfully employed. Besides, the mirror technique is introduced, which exploits reflection at a metallised back side to enable the measurement directly below a top metallisation, while illuminating from the top.arXiv:2211.10339oai:cds.cern.ch:28533862022-11-18 |
spellingShingle | physics.ins-det Detectors and Experimental Techniques Pape, Sebastian Curras, Esteban Fernandez Garcia, Marcos Moll, Michael Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique |
title | Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique |
title_full | Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique |
title_fullStr | Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique |
title_full_unstemmed | Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique |
title_short | Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique |
title_sort | techniques for the investigation of segmented sensors using the two photon absorption-transient current technique |
topic | physics.ins-det Detectors and Experimental Techniques |
url | https://dx.doi.org/10.3390/s23020962 http://cds.cern.ch/record/2853386 |
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