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TDCpix pixel detector ASIC with 100 ps time stamping

The TDCpix pixel read-out ASIC contains 1800 pixels arranged in 40 columns and 45 rows with the dimension of 300μm x 300μm. Each pixel contains a preamplifier and shaper circuit with a dynamic range of 0.8 to 10 fC and a rise time of 5 ns, followed by a Leading-Edge discriminator with Time-over-Thre...

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Autores principales: Rinella, G Aglieri, Bonacini, S, Jarron, P, Kaplon, J, Kluge, A, Martin Albarran, E, Morel, M, Noy, M, Perktold, L, Perrin-Terrin, M, Poltorak, K
Lenguaje:eng
Publicado: 2023
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2023.168331
http://cds.cern.ch/record/2861088
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author Rinella, G Aglieri
Bonacini, S
Jarron, P
Kaplon, J
Kluge, A
Martin Albarran, E
Morel, M
Noy, M
Perktold, L
Perrin-Terrin, M
Poltorak, K
author_facet Rinella, G Aglieri
Bonacini, S
Jarron, P
Kaplon, J
Kluge, A
Martin Albarran, E
Morel, M
Noy, M
Perktold, L
Perrin-Terrin, M
Poltorak, K
author_sort Rinella, G Aglieri
collection CERN
description The TDCpix pixel read-out ASIC contains 1800 pixels arranged in 40 columns and 45 rows with the dimension of 300μm x 300μm. Each pixel contains a preamplifier and shaper circuit with a dynamic range of 0.8 to 10 fC and a rise time of 5 ns, followed by a Leading-Edge discriminator with Time-over-Threshold correction. The discriminator outputs of each pixel are connected to time-to-digital converters (TDC) measuring the time when the input signal has exceeded the threshold and the pulse width with a binning of 97 ps. The electronics noise of pre-amplifier/shaper is 170 e− or 2.7 mV rms with a gain of 65 mV/fC. The jitter of the entire processing chain for an electrical input signal of 2.4 fC is lower than 60 ps rms. The ASIC has been designed to work in radiated environments of 6 * 104 Gray per year and 2 x 1014 1 MeV neutron equivalent cm−2.
id cern-2861088
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2023
record_format invenio
spelling cern-28610882023-08-24T08:53:29Zdoi:10.1016/j.nima.2023.168331http://cds.cern.ch/record/2861088engRinella, G AglieriBonacini, SJarron, PKaplon, JKluge, AMartin Albarran, EMorel, MNoy, MPerktold, LPerrin-Terrin, MPoltorak, KTDCpix pixel detector ASIC with 100 ps time stampingDetectors and Experimental TechniquesThe TDCpix pixel read-out ASIC contains 1800 pixels arranged in 40 columns and 45 rows with the dimension of 300μm x 300μm. Each pixel contains a preamplifier and shaper circuit with a dynamic range of 0.8 to 10 fC and a rise time of 5 ns, followed by a Leading-Edge discriminator with Time-over-Threshold correction. The discriminator outputs of each pixel are connected to time-to-digital converters (TDC) measuring the time when the input signal has exceeded the threshold and the pulse width with a binning of 97 ps. The electronics noise of pre-amplifier/shaper is 170 e− or 2.7 mV rms with a gain of 65 mV/fC. The jitter of the entire processing chain for an electrical input signal of 2.4 fC is lower than 60 ps rms. The ASIC has been designed to work in radiated environments of 6 * 104 Gray per year and 2 x 1014 1 MeV neutron equivalent cm−2.oai:cds.cern.ch:28610882023
spellingShingle Detectors and Experimental Techniques
Rinella, G Aglieri
Bonacini, S
Jarron, P
Kaplon, J
Kluge, A
Martin Albarran, E
Morel, M
Noy, M
Perktold, L
Perrin-Terrin, M
Poltorak, K
TDCpix pixel detector ASIC with 100 ps time stamping
title TDCpix pixel detector ASIC with 100 ps time stamping
title_full TDCpix pixel detector ASIC with 100 ps time stamping
title_fullStr TDCpix pixel detector ASIC with 100 ps time stamping
title_full_unstemmed TDCpix pixel detector ASIC with 100 ps time stamping
title_short TDCpix pixel detector ASIC with 100 ps time stamping
title_sort tdcpix pixel detector asic with 100 ps time stamping
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2023.168331
http://cds.cern.ch/record/2861088
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