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Investigation of the Boron removal effect induced by 5.5 MeV electrons on highly doped EPI- and Cz-silicon
This study focuses on the properties of the B<math altimg="si213.svg" display="inline" id="d1e2401"><msub><mrow/><mrow><mtext>i</mtext></mrow></msub></math>O<math altimg="si213.svg" display="inline&...
Autores principales: | Liao, C., Fretwurst, E., Garutti, E., Schwandt, J., Makarenko, L., Pintilie, I., Filip, Lucian D., Himmerlich, A., Moll, M., Gurimskaya, Y., Li, Z. |
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Lenguaje: | eng |
Publicado: |
2023
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2023.168559 http://cds.cern.ch/record/2866067 |
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