Test-beam Performance Results of the FASTPIX Sub-Nanosecond CMOS Pixel Sensor Demonstrator

Within the ATTRACT FASTPIX project, a monolithic pixel sensor demonstrator chip was developed in a modified 180 nm CMOS imaging process technology, targeting sub-nanosecond timing precision for single ionizing particles. It features a small collection electrode design on a 25 l. 143 <math altimg=...

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Detalles Bibliográficos
Autores principales: Braach, Justus, Buschmann, Eric, Dannheim, Dominik, Dort, Katharina, Kugathasan, Thanushan, Munker, Magdalena, Snoeys, Walter, Švihra, Peter, Vicente, Mateus
Lenguaje:eng
Publicado: 2023
Materias:
physics.ins-det
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2023.168641
http://cds.cern.ch/record/2868108

Internet

https://dx.doi.org/10.1016/j.nima.2023.168641
http://cds.cern.ch/record/2868108

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