Exploring Radiation-Induced Vulnerabilities in RFICs Through Traditional RF Metrics

This article describes how to analyze radiation-induced effects using traditional radio-frequency (RF) metrics in RF integrated circuits (RFICs) to be used in the implementation of software-defined radios (SDRs). The impacts of total ionizing dose (TID) and single-event effects (SEEs) on the device...

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Detalles Bibliográficos
Autores principales: Scialdone, Antonio, Ferraro, Rudy, Dilillo, Luigi, Saigne, Frederic, Boch, Jérôme, Masi, Alessandro, Danzeca, Salvatore
Lenguaje:eng
Publicado: 2023
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/TNS.2023.3270206
http://cds.cern.ch/record/2875196

Internet

https://dx.doi.org/10.1109/TNS.2023.3270206
http://cds.cern.ch/record/2875196

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