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The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices
A high-energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low-energy photons...
| Autores principales: | , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2023
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2023.3279626 http://cds.cern.ch/record/2875208 |
| _version_ | 1780978889653223424 |
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| author | Girones, Vincent Boch, Jérôme Carapelle, Alain Chapon, Arnaud Maraine, Tadec Labau, Timothee Saigné, Frédéric García Alía, Rubén |
| author_facet | Girones, Vincent Boch, Jérôme Carapelle, Alain Chapon, Arnaud Maraine, Tadec Labau, Timothee Saigné, Frédéric García Alía, Rubén |
| author_sort | Girones, Vincent |
| collection | CERN |
| description | A high-energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low-energy photons. Experimental results and simulations show that it is possible to filter the spectrum. From this result, the filtered X-ray generator is used to study the dose response of the electronic components, and the obtained data are compared to the cobalt 60 (60-Co) irradiation. The obtained results are analyzed and discussed. This work provides a first demonstration of the use of a filtered high-energy X-Ray generator for TID testing. |
| id | cern-2875208 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2023 |
| record_format | invenio |
| spelling | cern-28752082023-10-10T22:59:47Zdoi:10.1109/TNS.2023.3279626http://cds.cern.ch/record/2875208engGirones, VincentBoch, JérômeCarapelle, AlainChapon, ArnaudMaraine, TadecLabau, TimotheeSaigné, FrédéricGarcía Alía, RubénThe Use of High-Energy X-Ray Generators for TID Testing of Electronic DevicesDetectors and Experimental TechniquesA high-energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low-energy photons. Experimental results and simulations show that it is possible to filter the spectrum. From this result, the filtered X-ray generator is used to study the dose response of the electronic components, and the obtained data are compared to the cobalt 60 (60-Co) irradiation. The obtained results are analyzed and discussed. This work provides a first demonstration of the use of a filtered high-energy X-Ray generator for TID testing.oai:cds.cern.ch:28752082023 |
| spellingShingle | Detectors and Experimental Techniques Girones, Vincent Boch, Jérôme Carapelle, Alain Chapon, Arnaud Maraine, Tadec Labau, Timothee Saigné, Frédéric García Alía, Rubén The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| title | The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| title_full | The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| title_fullStr | The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| title_full_unstemmed | The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| title_short | The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices |
| title_sort | use of high-energy x-ray generators for tid testing of electronic devices |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1109/TNS.2023.3279626 http://cds.cern.ch/record/2875208 |
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