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Quality assurance and testing before, during, and after construction of semiconductor tracking detectors
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| Lenguaje: | eng |
| Publicado: |
1995
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| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(96)00618-3 http://cds.cern.ch/record/293394 |
| Descripción no disponible. |