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Quality assurance and testing before, during, and after construction of semiconductor tracking detectors
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
1995
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(96)00618-3 http://cds.cern.ch/record/293394 |
| _version_ | 1780888792870158336 |
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| author | Runólfsson, O |
| author_facet | Runólfsson, O |
| author_sort | Runólfsson, O |
| collection | CERN |
| id | cern-293394 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1995 |
| record_format | invenio |
| spelling | cern-2933942019-09-30T06:29:59Zdoi:10.1016/S0168-9002(96)00618-3http://cds.cern.ch/record/293394engRunólfsson, OQuality assurance and testing before, during, and after construction of semiconductor tracking detectorsDetectors and Experimental TechniquesCERN-PPE-95-163oai:cds.cern.ch:2933941995-11-13 |
| spellingShingle | Detectors and Experimental Techniques Runólfsson, O Quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| title | Quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| title_full | Quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| title_fullStr | Quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| title_full_unstemmed | Quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| title_short | Quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| title_sort | quality assurance and testing before, during, and after construction of semiconductor tracking detectors |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/S0168-9002(96)00618-3 http://cds.cern.ch/record/293394 |
| work_keys_str_mv | AT runolfssono qualityassuranceandtestingbeforeduringandafterconstructionofsemiconductortrackingdetectors |