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Emission channeling investigation of implantation defects and impurities in II-VI-semiconductors

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Detalles Bibliográficos
Autores principales:	Bollmann, J, Czermak, A, Jahn, S G
Lenguaje:	eng
Publicado:	1993
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/294751

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