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Combined electrical, optical and nuclear investigations of impurities and defects in II-VI semiconductors

Detalles Bibliográficos
Autores principales:	Achtziger, N, Baurichter, A, Bollmann, J
Lenguaje:	eng
Publicado:	1992
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/295364

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