Microscopical studies of structural and electronic properties of semiconducuctors

Detalles Bibliográficos
Autores principales: Deicher, M, Keller, R, Pfeiffer, Wolfgang
Lenguaje:eng
Publicado: 1990
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/299601
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author Deicher, M
Keller, R
Pfeiffer, Wolfgang
author_facet Deicher, M
Keller, R
Pfeiffer, Wolfgang
author_sort Deicher, M
collection CERN
id cern-299601
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1990
record_format invenio
spelling cern-2996012019-09-30T06:29:59Zhttp://cds.cern.ch/record/299601engDeicher, MKeller, RPfeiffer, WolfgangMicroscopical studies of structural and electronic properties of semiconducuctorsDetectors and Experimental TechniquesCERN-PSCC-90-4PSCC-S-122oai:cds.cern.ch:2996011990
spellingShingle Detectors and Experimental Techniques
Deicher, M
Keller, R
Pfeiffer, Wolfgang
Microscopical studies of structural and electronic properties of semiconducuctors
title Microscopical studies of structural and electronic properties of semiconducuctors
title_full Microscopical studies of structural and electronic properties of semiconducuctors
title_fullStr Microscopical studies of structural and electronic properties of semiconducuctors
title_full_unstemmed Microscopical studies of structural and electronic properties of semiconducuctors
title_short Microscopical studies of structural and electronic properties of semiconducuctors
title_sort microscopical studies of structural and electronic properties of semiconducuctors
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/299601
work_keys_str_mv AT deicherm microscopicalstudiesofstructuralandelectronicpropertiesofsemiconducuctors
AT kellerr microscopicalstudiesofstructuralandelectronicpropertiesofsemiconducuctors
AT pfeifferwolfgang microscopicalstudiesofstructuralandelectronicpropertiesofsemiconducuctors

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