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A sampling circuit using a beam deflection tube

Detalles Bibliográficos
Autor principal: Verweij, H
Lenguaje:eng
Publicado: 1961
Materias:
Acceso en línea:http://cds.cern.ch/record/300082
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author Verweij, H
author_facet Verweij, H
author_sort Verweij, H
collection CERN
id cern-300082
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1961
record_format invenio
spelling cern-3000822019-09-30T06:29:59Zhttp://cds.cern.ch/record/300082engVerweij, HA sampling circuit using a beam deflection tubeDetectors and Experimental TechniquesCERN-Electronics-Group-Note-61-7oai:cds.cern.ch:3000821961
spellingShingle Detectors and Experimental Techniques
Verweij, H
A sampling circuit using a beam deflection tube
title A sampling circuit using a beam deflection tube
title_full A sampling circuit using a beam deflection tube
title_fullStr A sampling circuit using a beam deflection tube
title_full_unstemmed A sampling circuit using a beam deflection tube
title_short A sampling circuit using a beam deflection tube
title_sort sampling circuit using a beam deflection tube
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/300082
work_keys_str_mv AT verweijh asamplingcircuitusingabeamdeflectiontube
AT verweijh samplingcircuitusingabeamdeflectiontube