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A sampling circuit using a beam deflection tube
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
1961
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/300082 |
_version_ | 1780889411919020032 |
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author | Verweij, H |
author_facet | Verweij, H |
author_sort | Verweij, H |
collection | CERN |
id | cern-300082 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1961 |
record_format | invenio |
spelling | cern-3000822019-09-30T06:29:59Zhttp://cds.cern.ch/record/300082engVerweij, HA sampling circuit using a beam deflection tubeDetectors and Experimental TechniquesCERN-Electronics-Group-Note-61-7oai:cds.cern.ch:3000821961 |
spellingShingle | Detectors and Experimental Techniques Verweij, H A sampling circuit using a beam deflection tube |
title | A sampling circuit using a beam deflection tube |
title_full | A sampling circuit using a beam deflection tube |
title_fullStr | A sampling circuit using a beam deflection tube |
title_full_unstemmed | A sampling circuit using a beam deflection tube |
title_short | A sampling circuit using a beam deflection tube |
title_sort | sampling circuit using a beam deflection tube |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/300082 |
work_keys_str_mv | AT verweijh asamplingcircuitusingabeamdeflectiontube AT verweijh samplingcircuitusingabeamdeflectiontube |