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Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation

Detalles Bibliográficos
Autor principal: Schulz, T
Lenguaje:eng
Publicado: DESY 1996
Materias:
Acceso en línea:http://cds.cern.ch/record/300343
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author Schulz, T
author_facet Schulz, T
author_sort Schulz, T
collection CERN
id cern-300343
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
publisher DESY
record_format invenio
spelling cern-3003432019-09-30T06:29:59Zhttp://cds.cern.ch/record/300343engSchulz, TInvestigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiationDetectors and Experimental TechniquesDESYDESY-96-027oai:cds.cern.ch:3003431996
spellingShingle Detectors and Experimental Techniques
Schulz, T
Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
title Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
title_full Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
title_fullStr Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
title_full_unstemmed Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
title_short Investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
title_sort investigation on the long term behaviour of damage effects and corresponding defects in detector grade silicon after neutron irradiation
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/300343
work_keys_str_mv AT schulzt investigationonthelongtermbehaviourofdamageeffectsandcorrespondingdefectsindetectorgradesiliconafterneutronirradiation