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Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
1996
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/301681 |
| _version_ | 1780889526554591232 |
|---|---|
| author | Achtziger, N Boyn, R Buhrow, T |
| author_facet | Achtziger, N Boyn, R Buhrow, T |
| author_sort | Achtziger, N |
| collection | CERN |
| id | cern-301681 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1996 |
| record_format | invenio |
| spelling | cern-3016812019-09-30T06:29:59Zhttp://cds.cern.ch/record/301681engAchtziger, NBoyn, RBuhrow, TCombined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductorsDetectors and Experimental TechniquesCERN-ISC-96-16ISC-P-35-Add-1oai:cds.cern.ch:3016811996 |
| spellingShingle | Detectors and Experimental Techniques Achtziger, N Boyn, R Buhrow, T Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors |
| title | Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors |
| title_full | Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors |
| title_fullStr | Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors |
| title_full_unstemmed | Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors |
| title_short | Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors |
| title_sort | combined electrical, optical, and structural investigations of impurities and defects in wide-gap ii-vi semiconductors |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/301681 |
| work_keys_str_mv | AT achtzigern combinedelectricalopticalandstructuralinvestigationsofimpuritiesanddefectsinwidegapiivisemiconductors AT boynr combinedelectricalopticalandstructuralinvestigationsofimpuritiesanddefectsinwidegapiivisemiconductors AT buhrowt combinedelectricalopticalandstructuralinvestigationsofimpuritiesanddefectsinwidegapiivisemiconductors |