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Combined electrical, optical, and structural investigations of impurities and defects in wide-gap II-VI semiconductors

Detalles Bibliográficos
Autores principales:	Achtziger, N, Boyn, R, Buhrow, T
Lenguaje:	eng
Publicado:	1996
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/301681

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