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Damage observed in silicon diodes after low-energy pion irradiation

Detalles Bibliográficos
Autores principales:	Aarnio, Pertti A, Huhtinen, M, Pimiä, M, Kaita, K, Laakso, Mikko, Numminen, A, Ryytty, P
Lenguaje:	eng
Publicado:	1995
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1016/0168-9002(95)00008-9 http://cds.cern.ch/record/302525

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