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Study of charge collection and noise in non-irradiated and irradiated silicon detectors

The large collection and noise were studied in non-irradiated and irradiated silicon detectors as a function of temperature (T), shaping time (0) and fluence , up to about 1,2 x 10(14) protons per cm2 for minimum-ionizing electrons yielded by a 106 Ru source. The noise of irradiated detectors is fou...

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Detalles Bibliográficos
Autores principales: Leroy, C, Bates, S, Dezillie, B, Glaser, M, Lemeilleur, F, Trigger, I
Lenguaje:eng
Publicado: 1996
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(97)00004-1
http://cds.cern.ch/record/305519
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author Leroy, C
Bates, S
Dezillie, B
Glaser, M
Lemeilleur, F
Trigger, I
author_facet Leroy, C
Bates, S
Dezillie, B
Glaser, M
Lemeilleur, F
Trigger, I
author_sort Leroy, C
collection CERN
description The large collection and noise were studied in non-irradiated and irradiated silicon detectors as a function of temperature (T), shaping time (0) and fluence , up to about 1,2 x 10(14) protons per cm2 for minimum-ionizing electrons yielded by a 106 Ru source. The noise of irradiated detectors is found to be dominted for short shaping times (¾50ns) by a series noise compo- nent, while for longer shaping times („80ns) a parallel noise component (correlated with the reverse current) prevails. For non-irradiated detectors, where the reverse current is three orders of magnetude smaller compared with irradiated detectors, the series noises dominates over the whole range of shaping times investigated (20-150ns). A signal degradation is observed for irradiated detectors. However, the signal ca be distinguished from noise, even after a fluence of about 1.2 x10(14) protons per cm2, at a temperature of 6øC and with a shaping time tipical of rge LHC inter-bunch crossing time (20-30ns). The measurements of the signal as a function of voltage shows that irradiated detectors depleted at 50% of the full depletion voltage can still provide a measurable signal-to-noise ratio.
id cern-305519
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
record_format invenio
spelling cern-3055192019-09-30T06:29:59Zdoi:10.1016/S0168-9002(97)00004-1http://cds.cern.ch/record/305519engLeroy, CBates, SDezillie, BGlaser, MLemeilleur, FTrigger, IStudy of charge collection and noise in non-irradiated and irradiated silicon detectorsDetectors and Experimental TechniquesThe large collection and noise were studied in non-irradiated and irradiated silicon detectors as a function of temperature (T), shaping time (0) and fluence , up to about 1,2 x 10(14) protons per cm2 for minimum-ionizing electrons yielded by a 106 Ru source. The noise of irradiated detectors is found to be dominted for short shaping times (¾50ns) by a series noise compo- nent, while for longer shaping times („80ns) a parallel noise component (correlated with the reverse current) prevails. For non-irradiated detectors, where the reverse current is three orders of magnetude smaller compared with irradiated detectors, the series noises dominates over the whole range of shaping times investigated (20-150ns). A signal degradation is observed for irradiated detectors. However, the signal ca be distinguished from noise, even after a fluence of about 1.2 x10(14) protons per cm2, at a temperature of 6øC and with a shaping time tipical of rge LHC inter-bunch crossing time (20-30ns). The measurements of the signal as a function of voltage shows that irradiated detectors depleted at 50% of the full depletion voltage can still provide a measurable signal-to-noise ratio.CERN-ECP-96-005CERN-ECP-96-05CERN-ECP-96-5oai:cds.cern.ch:3055191996-05-30
spellingShingle Detectors and Experimental Techniques
Leroy, C
Bates, S
Dezillie, B
Glaser, M
Lemeilleur, F
Trigger, I
Study of charge collection and noise in non-irradiated and irradiated silicon detectors
title Study of charge collection and noise in non-irradiated and irradiated silicon detectors
title_full Study of charge collection and noise in non-irradiated and irradiated silicon detectors
title_fullStr Study of charge collection and noise in non-irradiated and irradiated silicon detectors
title_full_unstemmed Study of charge collection and noise in non-irradiated and irradiated silicon detectors
title_short Study of charge collection and noise in non-irradiated and irradiated silicon detectors
title_sort study of charge collection and noise in non-irradiated and irradiated silicon detectors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(97)00004-1
http://cds.cern.ch/record/305519
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