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Structural and electrical investigation of implantation damage annealing in CdTe

Detalles Bibliográficos
Autores principales:	Achtziger, N, Bollmann, J, Licht, T, Reinhold, B, Reislöhner, U, Röhrich, J, Rüb, M, Wienecke, M, Witthuhn, W
Lenguaje:	eng
Publicado:	1996
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1088/0268-1242/11/6/017 http://cds.cern.ch/record/306974

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