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X-ray based sub-picosecond electron bunch characterization using 90 degree
Autores principales: | Leemans, W P, Schönlein, R W, Volfbeyn, P, Chin, A, Glover, T E, Balling, P, Zolotorev, M S, Kim, K J, Chattopadhyay, S, Shank, C V |
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Lenguaje: | eng |
Publicado: |
1996
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/310152 |
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