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Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy
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| Lenguaje: | eng |
| Publicado: |
Wiley
1991
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| Acceso en línea: | http://cds.cern.ch/record/310445 |
| _version_ | 1780890044717858816 |
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| author | Eberhart, Jean Pierre |
| author_facet | Eberhart, Jean Pierre |
| author_sort | Eberhart, Jean Pierre |
| collection | CERN |
| id | cern-310445 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1991 |
| publisher | Wiley |
| record_format | invenio |
| spelling | cern-3104452021-04-22T03:32:13Zhttp://cds.cern.ch/record/310445engEberhart, Jean PierreStructural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopyEngineeringWileyoai:cds.cern.ch:3104451991 |
| spellingShingle | Engineering Eberhart, Jean Pierre Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title | Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_full | Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_fullStr | Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_full_unstemmed | Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_short | Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_sort | structural and chemical analysis of materials: x-ray, electron and neutron diffraction, x-ray, electron and ion spectrometry, electron microscopy |
| topic | Engineering |
| url | http://cds.cern.ch/record/310445 |
| work_keys_str_mv | AT eberhartjeanpierre structuralandchemicalanalysisofmaterialsxrayelectronandneutrondiffractionxrayelectronandionspectrometryelectronmicroscopy |