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Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy

Detalles Bibliográficos
Autor principal:	Eberhart, Jean Pierre
Lenguaje:	eng
Publicado:	Wiley 1991
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/310445

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