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Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
1996
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/313850 |
| _version_ | 1780890253576372224 |
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| author | Fourches, N T |
| author_facet | Fourches, N T |
| author_sort | Fourches, N T |
| collection | CERN |
| id | cern-313850 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1996 |
| record_format | invenio |
| spelling | cern-3138502019-09-30T06:29:59Zhttp://cds.cern.ch/record/313850engFourches, N TCharge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rateDetectors and Experimental Techniquesoai:cds.cern.ch:3138501996 |
| spellingShingle | Detectors and Experimental Techniques Fourches, N T Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| title | Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| title_full | Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| title_fullStr | Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| title_full_unstemmed | Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| title_short | Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| title_sort | charge build-up by irradiation in metal oxide semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/313850 |
| work_keys_str_mv | AT fourchesnt chargebuildupbyirradiationinmetaloxidesemiconductorstructuresatcryogenictemperaturesbasicmechanismsandinfluenceofdoseanddoserate |