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Charge build-up by irradiation in Metal Oxide Semiconductor structures at cryogenic temperatures: basic mechanisms and influence of dose and dose rate

Detalles Bibliográficos
Autor principal:	Fourches, N T
Lenguaje:	eng
Publicado:	1996
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/313850

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