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Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods

Detalles Bibliográficos
Autores principales: Wieteska, K, Wierzchowski, W, Graeff, W
Lenguaje:eng
Publicado: 1996
Materias:
Acceso en línea:http://cds.cern.ch/record/317675
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author Wieteska, K
Wierzchowski, W
Graeff, W
author_facet Wieteska, K
Wierzchowski, W
Graeff, W
author_sort Wieteska, K
collection CERN
id cern-317675
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
record_format invenio
spelling cern-3176752019-09-30T06:29:59Zhttp://cds.cern.ch/record/317675engWieteska, KWierzchowski, WGraeff, WLattice deformation studies in high energy ions implanted silicon by means of various X-ray methodsCondensed MatterJINR-E14-96-185oai:cds.cern.ch:3176751996-09-11
spellingShingle Condensed Matter
Wieteska, K
Wierzchowski, W
Graeff, W
Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods
title Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods
title_full Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods
title_fullStr Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods
title_full_unstemmed Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods
title_short Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods
title_sort lattice deformation studies in high energy ions implanted silicon by means of various x-ray methods
topic Condensed Matter
url http://cds.cern.ch/record/317675
work_keys_str_mv AT wieteskak latticedeformationstudiesinhighenergyionsimplantedsiliconbymeansofvariousxraymethods
AT wierzchowskiw latticedeformationstudiesinhighenergyionsimplantedsiliconbymeansofvariousxraymethods
AT graeffw latticedeformationstudiesinhighenergyionsimplantedsiliconbymeansofvariousxraymethods