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Lattice deformation studies in high energy ions implanted silicon by means of various X-ray methods

Detalles Bibliográficos
Autores principales:	Wieteska, K, Wierzchowski, W, Graeff, W
Lenguaje:	eng
Publicado:	1996
Materias:	Condensed Matter
Acceso en línea:	http://cds.cern.ch/record/317675

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