Cargando…
Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon
| Autores principales: | , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
1997
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/322242 |
| _version_ | 1780890749386096640 |
|---|---|
| author | Böhrer, J Burchard, A Gehlhoff, W |
| author_facet | Böhrer, J Burchard, A Gehlhoff, W |
| author_sort | Böhrer, J |
| collection | CERN |
| id | cern-322242 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| record_format | invenio |
| spelling | cern-3222422019-09-30T06:29:59Zhttp://cds.cern.ch/record/322242engBöhrer, JBurchard, AGehlhoff, WElectron paramagnetic resonance investigations of erbium andsilver related defects in siliconDetectors and Experimental TechniquesCERN-ISC-97-7ISC-P-83-Add-1oai:cds.cern.ch:3222421997 |
| spellingShingle | Detectors and Experimental Techniques Böhrer, J Burchard, A Gehlhoff, W Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| title | Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| title_full | Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| title_fullStr | Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| title_full_unstemmed | Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| title_short | Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| title_sort | electron paramagnetic resonance investigations of erbium andsilver related defects in silicon |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/322242 |
| work_keys_str_mv | AT bohrerj electronparamagneticresonanceinvestigationsoferbiumandsilverrelateddefectsinsilicon AT burcharda electronparamagneticresonanceinvestigationsoferbiumandsilverrelateddefectsinsilicon AT gehlhoffw electronparamagneticresonanceinvestigationsoferbiumandsilverrelateddefectsinsilicon |