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Electron paramagnetic resonance investigations of erbium andsilver related defects in silicon
Autores principales: | Böhrer, J, Burchard, A, Gehlhoff, W |
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Lenguaje: | eng |
Publicado: |
1997
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/322242 |
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