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Element depth profiles of porous silicon

Detalles Bibliográficos
Autores principales:	Kobzev, A P, Nikonov, O A, Kulik, M, Zuk, J, Krzyzanowski, M, Ochalski, T J
Lenguaje:	eng
Publicado:	1997
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/341124

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