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STK system acceptance tests
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
1997
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/344431 |
| _version_ | 1780891729027661824 |
|---|---|
| author | Grau, X F |
| author_facet | Grau, X F |
| author_sort | Grau, X F |
| collection | CERN |
| id | cern-344431 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| record_format | invenio |
| spelling | cern-3444312019-09-30T06:29:59Zhttp://cds.cern.ch/record/344431engGrau, X FSTK system acceptance testsComputing and ComputersCERN-IT-97-011oai:cds.cern.ch:3444311997-12-04 |
| spellingShingle | Computing and Computers Grau, X F STK system acceptance tests |
| title | STK system acceptance tests |
| title_full | STK system acceptance tests |
| title_fullStr | STK system acceptance tests |
| title_full_unstemmed | STK system acceptance tests |
| title_short | STK system acceptance tests |
| title_sort | stk system acceptance tests |
| topic | Computing and Computers |
| url | http://cds.cern.ch/record/344431 |
| work_keys_str_mv | AT grauxf stksystemacceptancetests |