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Total dose behavior of submicron and deep submicron CMOS technologies

Detalles Bibliográficos
Autores principales:	Anelli, G, Campbell, M, Dachs, C, Faccio, F, Giraldo, A, Heijne, Erik H M, Jarron, Pierre, Marchioro, A, Noah, E, Paccagnella, A, Signe, P M, Snoeys, W, Vleugels, K
Lenguaje:	eng
Publicado:	1997
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/349576

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