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Total dose behaviour of commercial submicron VLSI technologies at low dose rate
| Autores principales: | , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1997
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/349583 |
| _version_ | 1780892148560822272 |
|---|---|
| author | Giraldo, A Paccagnella, A Dachs, C Faccio, F Heijne, Erik H M Jarron, Pierre Kloukinas, Kostas C Marchioro, A |
| author_facet | Giraldo, A Paccagnella, A Dachs, C Faccio, F Heijne, Erik H M Jarron, Pierre Kloukinas, Kostas C Marchioro, A |
| author_sort | Giraldo, A |
| collection | CERN |
| id | cern-349583 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| record_format | invenio |
| spelling | cern-3495832019-09-30T06:29:59Zhttp://cds.cern.ch/record/349583engGiraldo, APaccagnella, ADachs, CFaccio, FHeijne, Erik H MJarron, PierreKloukinas, Kostas CMarchioro, ATotal dose behaviour of commercial submicron VLSI technologies at low dose rateDetectors and Experimental Techniquesoai:cds.cern.ch:3495831997 |
| spellingShingle | Detectors and Experimental Techniques Giraldo, A Paccagnella, A Dachs, C Faccio, F Heijne, Erik H M Jarron, Pierre Kloukinas, Kostas C Marchioro, A Total dose behaviour of commercial submicron VLSI technologies at low dose rate |
| title | Total dose behaviour of commercial submicron VLSI technologies at low dose rate |
| title_full | Total dose behaviour of commercial submicron VLSI technologies at low dose rate |
| title_fullStr | Total dose behaviour of commercial submicron VLSI technologies at low dose rate |
| title_full_unstemmed | Total dose behaviour of commercial submicron VLSI technologies at low dose rate |
| title_short | Total dose behaviour of commercial submicron VLSI technologies at low dose rate |
| title_sort | total dose behaviour of commercial submicron vlsi technologies at low dose rate |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/349583 |
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