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Total dose behaviour of commercial submicron VLSI technologies at low dose rate

Detalles Bibliográficos
Autores principales:	Giraldo, A, Paccagnella, A, Dachs, C, Faccio, F, Heijne, Erik H M, Jarron, Pierre, Kloukinas, Kostas C, Marchioro, A
Lenguaje:	eng
Publicado:	1997
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/349583

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