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Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures

Detalles Bibliográficos
Autores principales: Palmieri, V G, Borer, K, Janos, S, Da Vià, C, Casagrande, L
Lenguaje:eng
Publicado: 1998
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(98)00673-1
http://cds.cern.ch/record/354107