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Scanning force microscopy of heavy-ion tracks in lithium fluoride

Detalles Bibliográficos
Autores principales:	Müller, A, Neumann, R, Schwartz, K, Trautmann, C
Lenguaje:	eng
Publicado:	1998
Materias:	Other Fields of Physics
Acceso en línea:	http://cds.cern.ch/record/360548

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