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Studies of the radiation hardness of oxygen-enriched silicon detectors
Detectors of high-energy particles sustain substantial structural defects induced by the particles during the operation period. Some of the defects have been found to be electrically active, degrading the detector's performance. Understanding the mechanisms of the electrical activities and lear...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
1998
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(98)01476-4 http://cds.cern.ch/record/360553 |