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Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures
| Autores principales: | , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1997
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(97)01032-2 http://cds.cern.ch/record/365111 |
| _version_ | 1780892870677364736 |
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| author | Fourches, N T Abbon, P Chipaux, Rémi Delagnes, E Orsier, E Pailler, P Du Port de Pontcharra, J Rouger, M Sueur, M Truche, R |
| author_facet | Fourches, N T Abbon, P Chipaux, Rémi Delagnes, E Orsier, E Pailler, P Du Port de Pontcharra, J Rouger, M Sueur, M Truche, R |
| author_sort | Fourches, N T |
| collection | CERN |
| id | cern-365111 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1997 |
| record_format | invenio |
| spelling | cern-3651112019-09-30T06:29:59Zdoi:10.1016/S0168-9002(97)01032-2http://cds.cern.ch/record/365111engFourches, N TAbbon, PChipaux, RémiDelagnes, EOrsier, EPailler, PDu Port de Pontcharra, JRouger, MSueur, MTruche, RThick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperaturesDetectors and Experimental Techniquesoai:cds.cern.ch:3651111997 |
| spellingShingle | Detectors and Experimental Techniques Fourches, N T Abbon, P Chipaux, Rémi Delagnes, E Orsier, E Pailler, P Du Port de Pontcharra, J Rouger, M Sueur, M Truche, R Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| title | Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| title_full | Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| title_fullStr | Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| title_full_unstemmed | Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| title_short | Thick film SOI technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| title_sort | thick film soi technology: characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/S0168-9002(97)01032-2 http://cds.cern.ch/record/365111 |
| work_keys_str_mv | AT fourchesnt thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT abbonp thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT chipauxremi thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT delagnese thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT orsiere thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT paillerp thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT duportdepontcharraj thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT rougerm thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT sueurm thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures AT trucher thickfilmsoitechnologycharacteristicsofdevicesandperformanceofcircuitsforhighenergyphysicsatcryogenictemperatures |