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High rate behavior and discharge limits in micro-pattern detectors

We present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strip micro...

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Detalles Bibliográficos
Autores principales: Bressan, A, Hoch, M, Pagano, P, Ropelewski, Leszek, Sauli, Fabio, Biagi, S F, Buzulutskov, A F, Gruwé, M, De Lentdecker, G, Mörmann, D, Sharma, A
Lenguaje:eng
Publicado: 1998
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(98)01317-5
http://cds.cern.ch/record/366793
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author Bressan, A
Hoch, M
Pagano, P
Ropelewski, Leszek
Sauli, Fabio
Biagi, S F
Buzulutskov, A F
Gruwé, M
De Lentdecker, G
Mörmann, D
Sharma, A
author_facet Bressan, A
Hoch, M
Pagano, P
Ropelewski, Leszek
Sauli, Fabio
Biagi, S F
Buzulutskov, A F
Gruwé, M
De Lentdecker, G
Mörmann, D
Sharma, A
author_sort Bressan, A
collection CERN
description We present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strip micromegas, micro-dot, gas electron multiplier, CAT (compteur à trous), trench (or groove), micro-CAT (or WELL) detectors, as well as systems with two elements of gaseous amplification in cascade. We confirm the general trend of all single-stage detectors to follow Raether's criterion, i.e. a spontaneous transition from avalanche to streamer, followed by a discharge, when the avalanche size reaches a value of a few 10 7 ; a noticeable exception is the micro-dot counter holding more than 10 8. In multiple structures, where the gain under irradiation is increased by at least one order of magnitude; we speculate this to be a consequence of a voltage dependence of Raether's limit, larger for low operating potentials. Our conclusion is that only multiple devices can guarantee a sufficient margin of reliability for operation in harsh LHC running conditions.
id cern-366793
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1998
record_format invenio
spelling cern-3667932019-09-30T06:29:59Zdoi:10.1016/S0168-9002(98)01317-5http://cds.cern.ch/record/366793engBressan, AHoch, MPagano, PRopelewski, LeszekSauli, FabioBiagi, S FBuzulutskov, A FGruwé, MDe Lentdecker, GMörmann, DSharma, AHigh rate behavior and discharge limits in micro-pattern detectorsDetectors and Experimental TechniquesWe present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strip micromegas, micro-dot, gas electron multiplier, CAT (compteur à trous), trench (or groove), micro-CAT (or WELL) detectors, as well as systems with two elements of gaseous amplification in cascade. We confirm the general trend of all single-stage detectors to follow Raether's criterion, i.e. a spontaneous transition from avalanche to streamer, followed by a discharge, when the avalanche size reaches a value of a few 10 7 ; a noticeable exception is the micro-dot counter holding more than 10 8. In multiple structures, where the gain under irradiation is increased by at least one order of magnitude; we speculate this to be a consequence of a voltage dependence of Raether's limit, larger for low operating potentials. Our conclusion is that only multiple devices can guarantee a sufficient margin of reliability for operation in harsh LHC running conditions.CERN-EP-98-139oai:cds.cern.ch:3667931998-09-18
spellingShingle Detectors and Experimental Techniques
Bressan, A
Hoch, M
Pagano, P
Ropelewski, Leszek
Sauli, Fabio
Biagi, S F
Buzulutskov, A F
Gruwé, M
De Lentdecker, G
Mörmann, D
Sharma, A
High rate behavior and discharge limits in micro-pattern detectors
title High rate behavior and discharge limits in micro-pattern detectors
title_full High rate behavior and discharge limits in micro-pattern detectors
title_fullStr High rate behavior and discharge limits in micro-pattern detectors
title_full_unstemmed High rate behavior and discharge limits in micro-pattern detectors
title_short High rate behavior and discharge limits in micro-pattern detectors
title_sort high rate behavior and discharge limits in micro-pattern detectors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(98)01317-5
http://cds.cern.ch/record/366793
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