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High rate behavior and discharge limits in micro-pattern detectors
We present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strip micro...
Autores principales: | , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
1998
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(98)01317-5 http://cds.cern.ch/record/366793 |
_version_ | 1780892943102509056 |
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author | Bressan, A Hoch, M Pagano, P Ropelewski, Leszek Sauli, Fabio Biagi, S F Buzulutskov, A F Gruwé, M De Lentdecker, G Mörmann, D Sharma, A |
author_facet | Bressan, A Hoch, M Pagano, P Ropelewski, Leszek Sauli, Fabio Biagi, S F Buzulutskov, A F Gruwé, M De Lentdecker, G Mörmann, D Sharma, A |
author_sort | Bressan, A |
collection | CERN |
description | We present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strip micromegas, micro-dot, gas electron multiplier, CAT (compteur à trous), trench (or groove), micro-CAT (or WELL) detectors, as well as systems with two elements of gaseous amplification in cascade. We confirm the general trend of all single-stage detectors to follow Raether's criterion, i.e. a spontaneous transition from avalanche to streamer, followed by a discharge, when the avalanche size reaches a value of a few 10 7 ; a noticeable exception is the micro-dot counter holding more than 10 8. In multiple structures, where the gain under irradiation is increased by at least one order of magnitude; we speculate this to be a consequence of a voltage dependence of Raether's limit, larger for low operating potentials. Our conclusion is that only multiple devices can guarantee a sufficient margin of reliability for operation in harsh LHC running conditions. |
id | cern-366793 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1998 |
record_format | invenio |
spelling | cern-3667932019-09-30T06:29:59Zdoi:10.1016/S0168-9002(98)01317-5http://cds.cern.ch/record/366793engBressan, AHoch, MPagano, PRopelewski, LeszekSauli, FabioBiagi, S FBuzulutskov, A FGruwé, MDe Lentdecker, GMörmann, DSharma, AHigh rate behavior and discharge limits in micro-pattern detectorsDetectors and Experimental TechniquesWe present and discuss a set of systematic measurements, carried out with gaseous proportional micro-pattern detectors, in order to assess their maximum gain when irradiated with high-rate soft X-rays and heavily ionizing alpha particles. The inventory of detectors tested includes: micro-strip micromegas, micro-dot, gas electron multiplier, CAT (compteur à trous), trench (or groove), micro-CAT (or WELL) detectors, as well as systems with two elements of gaseous amplification in cascade. We confirm the general trend of all single-stage detectors to follow Raether's criterion, i.e. a spontaneous transition from avalanche to streamer, followed by a discharge, when the avalanche size reaches a value of a few 10 7 ; a noticeable exception is the micro-dot counter holding more than 10 8. In multiple structures, where the gain under irradiation is increased by at least one order of magnitude; we speculate this to be a consequence of a voltage dependence of Raether's limit, larger for low operating potentials. Our conclusion is that only multiple devices can guarantee a sufficient margin of reliability for operation in harsh LHC running conditions.CERN-EP-98-139oai:cds.cern.ch:3667931998-09-18 |
spellingShingle | Detectors and Experimental Techniques Bressan, A Hoch, M Pagano, P Ropelewski, Leszek Sauli, Fabio Biagi, S F Buzulutskov, A F Gruwé, M De Lentdecker, G Mörmann, D Sharma, A High rate behavior and discharge limits in micro-pattern detectors |
title | High rate behavior and discharge limits in micro-pattern detectors |
title_full | High rate behavior and discharge limits in micro-pattern detectors |
title_fullStr | High rate behavior and discharge limits in micro-pattern detectors |
title_full_unstemmed | High rate behavior and discharge limits in micro-pattern detectors |
title_short | High rate behavior and discharge limits in micro-pattern detectors |
title_sort | high rate behavior and discharge limits in micro-pattern detectors |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1016/S0168-9002(98)01317-5 http://cds.cern.ch/record/366793 |
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