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Radiation hardening of VLSI-electronics

Detalles Bibliográficos
Autores principales:	Wulf, F, Bräunig, D, Boden, A
Lenguaje:	eng
Publicado:	CERN 1989
Materias:	XX
Acceso en línea:	https://dx.doi.org/10.5170/CERN-1989-010-V-2.681 http://cds.cern.ch/record/368567

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