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Laterally resolved measurements of polycrystalline cesium iodide surfaces
Autores principales: | Rudolf, P, Marchal, F, Sporken, R, Caudano, R, Dell'Orto, T, Almeida, J, Braem, André, Piuz, François, Sgobba, Stefano, Paic, G, Nappi, E, Valentini, A, Sartori, P, Coluzza, C |
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Lenguaje: | eng |
Publicado: |
1997
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/372495 |
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