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Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
1998
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/373307 |
| _version_ | 1780893202641846272 |
|---|---|
| author | Grim, G P Pellett, D E |
| author_facet | Grim, G P Pellett, D E |
| author_sort | Grim, G P |
| collection | CERN |
| id | cern-373307 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1998 |
| record_format | invenio |
| spelling | cern-3733072019-09-30T06:29:59Zhttp://cds.cern.ch/record/373307engGrim, G PPellett, D EStudy of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadronsDetectors and Experimental TechniquesFERMILAB-CONF-98-196-Goai:cds.cern.ch:3733071998 |
| spellingShingle | Detectors and Experimental Techniques Grim, G P Pellett, D E Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons |
| title | Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons |
| title_full | Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons |
| title_fullStr | Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons |
| title_full_unstemmed | Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons |
| title_short | Study of radiation damage to Honeywell RICMOS-IV SOI transistors by charged hadrons |
| title_sort | study of radiation damage to honeywell ricmos-iv soi transistors by charged hadrons |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/373307 |
| work_keys_str_mv | AT grimgp studyofradiationdamagetohoneywellricmosivsoitransistorsbychargedhadrons AT pellettde studyofradiationdamagetohoneywellricmosivsoitransistorsbychargedhadrons |