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Heavy-ion induced damage of crystalline Ge and W at 0.5 to 8 A MeV range

Detalles Bibliográficos
Autores principales:	Huber, H, Assmann, R W, Karamian, S A, Mieskes, H D, Nolte, H, Gazis, E N, Kokkoris, M, Kossionides, S, Vlastou, R, Grötzschel, R, Mücklich, A, Prusseit, W
Lenguaje:	eng
Publicado:	1998
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/375808

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