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Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
1998
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/384844 |
| _version_ | 1780893556736524288 |
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| author | Ditlov, V A |
| author_facet | Ditlov, V A |
| author_sort | Ditlov, V A |
| collection | CERN |
| id | cern-384844 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1998 |
| record_format | invenio |
| spelling | cern-3848442019-09-30T06:29:59Zhttp://cds.cern.ch/record/384844engDitlov, V ARegistration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperaturesDetectors and Experimental TechniquesITEP-98-38oai:cds.cern.ch:3848441998-10-09 |
| spellingShingle | Detectors and Experimental Techniques Ditlov, V A Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| title | Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| title_full | Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| title_fullStr | Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| title_full_unstemmed | Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| title_short | Registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| title_sort | registration parameters of polyethyleneterephthalate detector defined from tracks of ions after additional exposure by homogeneous gamma-radiation for different etching temperatures |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/384844 |
| work_keys_str_mv | AT ditlovva registrationparametersofpolyethyleneterephthalatedetectordefinedfromtracksofionsafteradditionalexposurebyhomogeneousgammaradiationfordifferentetchingtemperatures |