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Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$
| Autores principales: | , , , , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1999
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(98)01467-3 http://cds.cern.ch/record/395148 |
| _version_ | 1780893853430054912 |
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| author | Robinson, D Allport, P P Bizzell, J P Buttar, C M Carter, A A Carter, J R Goodrick, M J Greenall, A Hill, J C Morgan, D Munday, D J Ohsugi, T Phillips, P W Riedler, P Smith, N A Terada, S Turner, P R Unno, Y |
| author_facet | Robinson, D Allport, P P Bizzell, J P Buttar, C M Carter, A A Carter, J R Goodrick, M J Greenall, A Hill, J C Morgan, D Munday, D J Ohsugi, T Phillips, P W Riedler, P Smith, N A Terada, S Turner, P R Unno, Y |
| author_sort | Robinson, D |
| collection | CERN |
| id | cern-395148 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1999 |
| record_format | invenio |
| spelling | cern-3951482019-09-30T06:29:59Zdoi:10.1016/S0168-9002(98)01467-3http://cds.cern.ch/record/395148engRobinson, DAllport, P PBizzell, J PButtar, C MCarter, A ACarter, J RGoodrick, M JGreenall, AHill, J CMorgan, DMunday, D JOhsugi, TPhillips, P WRiedler, PSmith, N ATerada, STurner, P RUnno, YNoise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$Detectors and Experimental Techniquesoai:cds.cern.ch:3951481999 |
| spellingShingle | Detectors and Experimental Techniques Robinson, D Allport, P P Bizzell, J P Buttar, C M Carter, A A Carter, J R Goodrick, M J Greenall, A Hill, J C Morgan, D Munday, D J Ohsugi, T Phillips, P W Riedler, P Smith, N A Terada, S Turner, P R Unno, Y Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| title | Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| title_full | Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| title_fullStr | Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| title_full_unstemmed | Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| title_short | Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| title_sort | noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$ |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/S0168-9002(98)01467-3 http://cds.cern.ch/record/395148 |
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