Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to $3*10^{14} p cm^{-2}$

Detalles Bibliográficos
Autores principales: Robinson, D, Allport, P P, Bizzell, J P, Buttar, C M, Carter, A A, Carter, J R, Goodrick, M J, Greenall, A, Hill, J C, Morgan, D, Munday, D J, Ohsugi, T, Phillips, P W, Riedler, P, Smith, N A, Terada, S, Turner, P R, Unno, Y
Lenguaje:eng
Publicado: 1999
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(98)01467-3
http://cds.cern.ch/record/395148

Internet

https://dx.doi.org/10.1016/S0168-9002(98)01467-3
http://cds.cern.ch/record/395148

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