Cargando…
Reliability rating of electronic circuits
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
1964
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/399587 |
| _version_ | 1780894074864140288 |
|---|---|
| author | Shkundenkov, V N |
| author_facet | Shkundenkov, V N |
| author_sort | Shkundenkov, V N |
| collection | CERN |
| id | cern-399587 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1964 |
| record_format | invenio |
| spelling | cern-3995872019-09-30T06:29:59Zhttp://cds.cern.ch/record/399587engShkundenkov, V NReliability rating of electronic circuitsXXCERN-Trans-Int-71-10P-1828oai:cds.cern.ch:3995871964 |
| spellingShingle | XX Shkundenkov, V N Reliability rating of electronic circuits |
| title | Reliability rating of electronic circuits |
| title_full | Reliability rating of electronic circuits |
| title_fullStr | Reliability rating of electronic circuits |
| title_full_unstemmed | Reliability rating of electronic circuits |
| title_short | Reliability rating of electronic circuits |
| title_sort | reliability rating of electronic circuits |
| topic | XX |
| url | http://cds.cern.ch/record/399587 |
| work_keys_str_mv | AT shkundenkovvn reliabilityratingofelectroniccircuits |