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Defect evolution in silicon detector material
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
1996
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/399750 |
_version_ | 1780894081806761984 |
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author | MacEvoy, B C |
author_facet | MacEvoy, B C |
author_sort | MacEvoy, B C |
collection | CERN |
id | cern-399750 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1996 |
record_format | invenio |
spelling | cern-3997502019-09-30T06:29:59Zhttp://cds.cern.ch/record/399750engMacEvoy, B CDefect evolution in silicon detector materialDetectors and Experimental TechniquesCERN-OPEN-99-189IC-HEP-96-3oai:cds.cern.ch:3997501996-04-29 |
spellingShingle | Detectors and Experimental Techniques MacEvoy, B C Defect evolution in silicon detector material |
title | Defect evolution in silicon detector material |
title_full | Defect evolution in silicon detector material |
title_fullStr | Defect evolution in silicon detector material |
title_full_unstemmed | Defect evolution in silicon detector material |
title_short | Defect evolution in silicon detector material |
title_sort | defect evolution in silicon detector material |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/399750 |
work_keys_str_mv | AT macevoybc defectevolutioninsilicondetectormaterial |