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5th International Workshop on Beam Injection Assessment of Defects in Semiconductors
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
SciTec
1999
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/409040 |
| _version_ | 1780894489053757440 |
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| author | Kittler, M Breitenstein, O Endrös, A Schröter, W |
| author_facet | Kittler, M Breitenstein, O Endrös, A Schröter, W |
| author_sort | Kittler, M |
| collection | CERN |
| id | cern-409040 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1999 |
| publisher | SciTec |
| record_format | invenio |
| spelling | cern-4090402021-04-22T21:07:34Zhttp://cds.cern.ch/record/409040engKittler, MBreitenstein, OEndrös, ASchröter, W5th International Workshop on Beam Injection Assessment of Defects in SemiconductorsCondensed MatterSciTecoai:cds.cern.ch:4090401999 |
| spellingShingle | Condensed Matter Kittler, M Breitenstein, O Endrös, A Schröter, W 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors |
| title | 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors |
| title_full | 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors |
| title_fullStr | 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors |
| title_full_unstemmed | 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors |
| title_short | 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors |
| title_sort | 5th international workshop on beam injection assessment of defects in semiconductors |
| topic | Condensed Matter |
| url | http://cds.cern.ch/record/409040 |
| work_keys_str_mv | AT kittlerm 5thinternationalworkshoponbeaminjectionassessmentofdefectsinsemiconductors AT breitensteino 5thinternationalworkshoponbeaminjectionassessmentofdefectsinsemiconductors AT endrosa 5thinternationalworkshoponbeaminjectionassessmentofdefectsinsemiconductors AT schroterw 5thinternationalworkshoponbeaminjectionassessmentofdefectsinsemiconductors |