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5th International Workshop on Beam Injection Assessment of Defects in Semiconductors

Detalles Bibliográficos
Autores principales:	Kittler, M, Breitenstein, O, Endrös, A, Schröter, W
Lenguaje:	eng
Publicado:	SciTec 1999
Materias:	Condensed Matter
Acceso en línea:	http://cds.cern.ch/record/409040

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