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Microstructural characterization of materials
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Wiley
1999
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/410938 |
_version_ | 1780894608037773312 |
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author | Brandon, David G Kaplan, Wayne D |
author_facet | Brandon, David G Kaplan, Wayne D |
author_sort | Brandon, David G |
collection | CERN |
id | cern-410938 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1999 |
publisher | Wiley |
record_format | invenio |
spelling | cern-4109382021-04-22T03:12:51Zhttp://cds.cern.ch/record/410938engBrandon, David GKaplan, Wayne DMicrostructural characterization of materialsCondensed MatterWileyoai:cds.cern.ch:4109381999 |
spellingShingle | Condensed Matter Brandon, David G Kaplan, Wayne D Microstructural characterization of materials |
title | Microstructural characterization of materials |
title_full | Microstructural characterization of materials |
title_fullStr | Microstructural characterization of materials |
title_full_unstemmed | Microstructural characterization of materials |
title_short | Microstructural characterization of materials |
title_sort | microstructural characterization of materials |
topic | Condensed Matter |
url | http://cds.cern.ch/record/410938 |
work_keys_str_mv | AT brandondavidg microstructuralcharacterizationofmaterials AT kaplanwayned microstructuralcharacterizationofmaterials |