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Microstructural characterization of materials

Detalles Bibliográficos
Autores principales: Brandon, David G, Kaplan, Wayne D
Lenguaje:eng
Publicado: Wiley 1999
Materias:
Acceso en línea:http://cds.cern.ch/record/410938
_version_ 1780894608037773312
author Brandon, David G
Kaplan, Wayne D
author_facet Brandon, David G
Kaplan, Wayne D
author_sort Brandon, David G
collection CERN
id cern-410938
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1999
publisher Wiley
record_format invenio
spelling cern-4109382021-04-22T03:12:51Zhttp://cds.cern.ch/record/410938engBrandon, David GKaplan, Wayne DMicrostructural characterization of materialsCondensed MatterWileyoai:cds.cern.ch:4109381999
spellingShingle Condensed Matter
Brandon, David G
Kaplan, Wayne D
Microstructural characterization of materials
title Microstructural characterization of materials
title_full Microstructural characterization of materials
title_fullStr Microstructural characterization of materials
title_full_unstemmed Microstructural characterization of materials
title_short Microstructural characterization of materials
title_sort microstructural characterization of materials
topic Condensed Matter
url http://cds.cern.ch/record/410938
work_keys_str_mv AT brandondavidg microstructuralcharacterizationofmaterials
AT kaplanwayned microstructuralcharacterizationofmaterials