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Defect and microstructure analysis by diffraction

Detalles Bibliográficos
Autores principales:	Snyder, Robert L, Bunge, Hans J, Fiala, Jaroslav
Lenguaje:	eng
Publicado:	Oxford Univ. Press 1999
Materias:	Condensed Matter
Acceso en línea:	http://cds.cern.ch/record/422913

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